High-precision, flexible resistivity measurement system 'VR300DSE-2P'
High-precision measurement of ultra-thin films and ultra-shallow ion implantation layers using a probe-driven control mechanism.
The "VR300DSE-2P" is a fully automatic four-probe measurement device that achieves high-precision measurement of the resistivity and sheet resistance of conductive samples such as silicon wafers and magnetic thin films, thanks to our core technology, the probe drive control system. We also offer models with all functions, such as the "VR300DSE," as well as tabletop models like the "VR300DE" and "VR250." 【Features】 ■ Probe drive setup possible via recipes ■ Reduced cost of ownership through high throughput ■ Supports two load ports ■ Automatic conditioning function for probe needle tips ■ Capable of creating contour maps and three-dimensional maps of resistivity distribution *For more details, please refer to the PDF materials or feel free to contact us.
- Company：国際電気セミコンダクターサービス
- Price：Other
